SMT007 Magazine

June 2015 • SMT Magazine 23 TeST MATCH—PARTneRInG SPeCIALIST BOunDARy-SCAn WITH ICT continues Figure 3: Specialist boundary-scan can work alongside icT to increase fault coverage and simplify test creation and fault analysis. Feature

• Cover
• Featured Content — Test & Inspection
• Contents
• Feature — High-Density Interconnect and Embedded Board Test
• Short — SMART Group's 2015 European Conference
• Feature — Test Match-Partnering Specialist Boundary-Scan with ICT
• Feature — In-line Solder Penetration Testing with 3D X-ray Inspection
• Feature — Acoustic Surface Flatness of Components and Boards
• News — EIN Market Highlights
• Feature Interview — Inspection: The Last Line of Defense
• Video Interview — Solving Inspection Problems with True 3D in AOI, AXI and SPI Systems
• News — SMT007 Supplier/New Product News Highlights
• Article — Event Review: 6th Electronic Materials and Processes for Space Workshop (EMPS-6)
• News — Mil/Aero007 News Highlights
• Column — In-Circuit Pin Testing: An Excellent Potential Source of Value Creation
• Video Interview — Open Failure Analysis Lab Assessment Service Available
• Top Ten Recent Highlights from SMT007
• Events Calendar
• Advertiser Index and Masthead