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82 SMT Magazine • December 2016 BOUNDARY SCAN MEETS FUNCTIONAL TEST Work Separately, but Test Together Even though the above-mentioned func- tional test processes already offer many new possibilities in themselves, the full potential is only unlocked when they are combined in a meaningful way. The JTAG processes have the advantage that they all use the same infrastruc- ture (Figure 9). It is easy to create an interac- tive mix of structure and functional tests based on corresponding multifunctional system solu- tions. Complete desktop JTAG testers, such as the JULIET system [10], are also available for pro- duction requirements (Figure 10). With inte- grated I/O modules with a wide range of func- tional test instruments and pin adaptation, the Figure 8: Embedding of a complete ATE through a test and diagnostic system. Figure 9: Uniform JTAG control of boundary scan, FPGA embedded control instruments and processor emulation.