DARPA Unveils Tool that Identifies Counterfeit Electronics

October 2, 2014
"The Advanced Scanning Optical Microscope—one of many IRIS--developed technologies--offers important hardware security and reliability assurance capabilities," said Kerry Bernstein, DARPA program manager. "These tools are optimized to support the mission of ensuring trust in microelectronics in DoD labs such as NSWC Crane."
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