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April 2016 • SMT Magazine 67 EnablinG ProcEss innovaTion ThrouGh TEsT and mEasurEmEnT soluTions from high-definition video playing continuous- ly…for 1 million years. NI describes big analog data solutions using a three-tier solution architecture, meaning so- lutions are made up of solution elements that fit into three distinct tiers. These come together to create a single, integrated solution that can be used from the point when data is initially acquired (from a sensor) to ultimately the deci- sion that is made based on this data to help cus- tomers make better decisions for their assembly and manufacturing processes. The first step in making a decision based on data comes from accurately acquiring it. Analog data comes from acquiring natural phenomena such as temperature, strain, pressure, and so on. Because the varied sources of analog data are so great, each system requires specific sensors and actuators (if used in a controls application) to meet the needs of the type and magnitude of natural phenomena being measured. The second tier looks at the data acquisi- tion systems and analysis itself. This is a valu- able piece of an end-to-end Big Data solution because these systems, such as NI CompactRIO, PXI, and NI CompactDAQ help connect the benefits of precise data acquired from a sensor to the benefits of in-depth data analysis, usu- ally while the data is real time or early life. The system nodes are network-connected hardware (with associated software) that perform A/D conversion, conditioning, and early analysis of the data acquired and help it move past "the edge" to the switch and server where it is stored and will likely undergo further analysis. This is the point at which customers can realize a great value from the data they've ac- quired and where many engineering, scientific, and business decisions are made. This tier also includes the cloud, a growing and appealing IT infrastructure for NI customers. Las Marias: Can you give some examples as to how NI is showing value to customers who are still under pressure to cut cost? Kranjc: We see this every single day. Today, we saw a few examples of how much we reduced testing time. And that's what I would say the main benefit that customers are getting from us: Instead of getting ten test systems for a man- ufacturing floor—which could mean millions of dollars of investment—they can have one or two systems, and have less staff at the end. At the same time, they can test even more. And it's all about really driving the cost down so that companies have lower CapEx and lower operating cost. And the products can go to the market faster. Las Marias: What are the key trends shaping the future of the T&M industry? Kranjc: Devices before are very simple. Now, whatever we use is becoming quite complex. It is forecast that there will be 50 billion devic- es becoming connected by 2020. So first, you know, the volume is there—every single device will contain quite a high degree of intelligence and connectivity. Then, every single device has to be tested. That volume and that huge diver- sity of all these devices will probably be the big- gest challenge when it comes to really building test systems faster, so that everyone can test at the end. And that I would say is a fantastic op- portunity for us. Las Marias: How important is the industrial Inter- net of Things (IIoT) trend for NI? Kranjc: It impacts everyone. Let's say around 10 years ago, we didn't have, I would say, apps—so productivity is pretty limited. Now, the mobile phone has a lot of intelligence, a lot of sensors. We have wearables now. Just walk around and you will see that everyone has at least one wear- able device that provides connectivity and com- putation. It's the same in the industrial space. " it is forecast that there will be 50 billion devices becoming connected by 2020. "