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72 The PCB Magazine • April 2016 tify potential outliers or wor- risome behavior. Arrhenius plots were constructed for an initial prediction on behav- ior and performance for the 25,000-hour test. Baseline dielectric break- down voltage data was col- lected for each laminate. Di- electric strength was then cal- culated by dividing dielectric breakdown voltage by thick- ness tested. Dielectric break- down voltage (V/mil) for each laminate is summarized in Ta- ble 5. A graphical representa- tion of dielectric strength data is presented in Figure 9. Table 6 provides a qualita- tive comparison between the five laminates. Laminates B and D have the overall high- long-term thermal reliability of pCb materials Table 4: Calculated 50% Retention using Regression Analysis of 500-Hour Data. (Used for guidance in T4 temperature selection for 1000-hour test.) Table 5: Baseline—Average Breakdown Strength, V/mil.