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June 2017 • SMT Magazine 37 AOI CAPABILITIES STUDY WITH 03015 COMPONENTS Figure 5: Optical metrology equipment picture for components with pitch 200 µm. Figure 6: Picture of AOI System 1, AOI System 2, AOI System 4, AOI System 5 and AOI System 6. Table 1: Attribute GR&R Results for AOI 1, AOI2, AOI 4, AOI 5 and AOI 6. the components R3, R9, R15, R72, R75, and R78 are confirmed as defects per the AOI image, op- tical image, and the engineers review. Figure 6 list pictures of four AOI machines for the same 24 components on the same board, where pad pitch is 200 µm. For these 24 com- ponents locations, nine are defects. Both of AOI System 1 and AOI System 4 have one false call with a red rectangle, while AOI System 6 has three false calls; however, it has 100% agree- ment with the standard list for AOI System 2, and AOI System 5. A yellow rectangle indicates the component as a defective location. It is not- ed that all AOI machines (AOI System 2, AOI System 4, AOI System 5 and AOI System 6 are 3D AOI machines) used their 2D algorithm to test these five boards since the height of 03015 components could not be measured because a mirror surface material of the component creat- ed noise at the machines. The AOI algorithm threshold for AOI Sys- tem 1, AOI System 2, AOI System 4, AOI Sys- tem 5 and AOI System 6 are listed in Table 2. All these algorithms are 2D AOI functional al- gorithms. AOI 1 machine was adjusted from the setting of 19 µm/pixel to 10.5 µm/pixel for im- proved resolution of the camera by the AOI Sys- tem 1 support engineer at our site. AOI System 2 is the 3D AOI machine with 6 µm resolution with camera type as 12Mpix. However, AOI Sys- tem 2 used its 2D algorithm (PadMatch) for test- ing 03015. The threshold settings are: Similari- ty: 55; Rotation: 4degree; Xshift, 35 µm; Yshift: 35 µm. AOI System 4 used its LW (length and width) tracking to test the 03015 component, the LW tracking is 2D algorithm, and its thresh- old settings for this project are: XY ± 35 µm, and for Theta, ± 10 µm. AOI System 5's main al- gorithms are: Classification Match, 180; Rota- tion, 5 degrees; Xshift, 35 µm; Yshift, 35 µm. The main algorithm for AOI System 6 are: hori-