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76 SMT Magazine • June 2017 compared to the surrounding flesh. X-ray ab- sorption contrast and image recognition tech- niques have limited application in this field as the bone fragments have a very similar X-ray absorption signature to the meat, resulting in edges and shapes that cannot be clearly identi- fied (Figure 5, top right). The MAP technology enables bone frag- ments in chicken to be identified by virtue of their material difference from surrounding chicken breast rather than by the absorption contrast formed in a grayscale image. Figure 5 shows an example of the detection of small bone fragments concealed inside a pile of chick- en breast meat pieces. This type of technique is particularly well suited to automated inspection systems and may be used to identify defects or impurities within PCBs and other electronic components that would otherwise be invisible in the gray- scale image. Map Enhanced 2D X-ray Inspection for the Electronics Industry Incorporation of the MAP technology into a 2D X-ray Inspection System A diagram showing the general outline of a modern 2D X-ray inspection system is present- ed in Figure 6. The heart of the system is an ex- tremely sharp nano-focus X-ray source allowing 100 nm feature recognition and a worry-free design that does not require filament chang- es through the life of the system. This is cou- pled with a high-bandwidth/low noise digital flat panel detector (FP). Some of the most ad- vanced FPs have up to 6.7 megapixels with a pixel size of 50 µm running at 30 frames per second. The samples (PCBs and other electron- ic components) are simply placed in the sam- ple tray. The sophisticated five-axis sample ma- nipulation system permits oblique imaging over 140° degrees (±70°). The FP detector can be 2D X-RAY INSPECTION WITH MATERIALS AND THICKNESS IDENTIFICATION Figure 6: Diagram of a modern 2D X-ray inspection system featuring a maintenance-free sealed transmission X-ray source allowing for 100 nm feature recognition coupled with 6.7 megapixels digital FP detector.