Issue link: https://iconnect007.uberflip.com/i/1528798
22 SMT007 MAGAZINE I NOVEMBER 2024 The Problem: SMT Output vs. Test Cell Throughput e main challenge for the test area is the discrepancy between the SMT production line and the actual test process. Test cells are designed to handle just one or two boards at a time, while SMT lines can output a significantly higher number of panels in the same amount of time. is leads to a buildup of work-in-prog- ress (WIP) inventory as panels sit in a queue, waiting to be tested. Traditional test cells may take hours or even days before the panels can be tested. What Is the Cost? First, accumulated WIP can make it difficult to identify and address defects promptly. If problems occur, it may be harder to trace them back to their source, leading to larger batches of costly rework or, in many instances, scrap. When defects are identified well aer produc- tion, the feedback loop is considerably lon- ger. is delay can result in recurring issues, as engineers may not fully understand the root cause until the problem has already manifested multiple times. In addition, fully assembled PCBs typically leave the SMT line in magazines, PCB stor- age containers, or racks and are transported to the test area to await availability on the test systems. e space required to store this additional WIP inventory occupies valuable floor space, hindering workflow and mak- ing it difficult to navigate the production area efficiently. Current Industry Response: Brute Force vs. Innovation When faced with these challenges, manufac- turers typically respond in one of two ways: 1. Living with the bottleneck: Some choose to accept the testing delays and the oper- ational risks that come with it, hoping no critical faults are missed. However, this strategy can be costly in the long run. 2. Brute force expansion: Others take a more aggressive approach by adding more test equipment and operators to clear the backlog. While this temporarily resolves the issue, it leads to significantly higher costs and a larger test cell footprint, which can create space and labor constraints. A New Approach Rather than accept the limitations of tradi- tional test methods or overinvesting in equip- ment, a new trend has emerged: automation of the test process through combined testing methods. Here, we'll focus on the increasing trend of automating the test process, exploring the advantages of doing so and the ideal candi- dates for this technology. Improvements in Technology Modern automated test systems have been designed to keep pace with high-speed SMT lines. ese systems have become more sophis- ticated, incorporating high-speed data pro- cessing and improved algorithms for quicker defect detection. A critical enhancement in " When defects are identified well aer production, the feedback loop is considerably longer. "