Issue link: https://iconnect007.uberflip.com/i/1534953
Ensuring the reliability of printed circuit boards (PCBs) has become increasingly difficult and critical, yet the development of advanced testing methodologies is essential to meet- ing industry demands and address- ing persistent challenges. One signif- icant innovation is the High Accelera- tion Thermal Shock (HATS²) test sys- tem, which transforms how reliability testing is conducted. After 40 years in the testing busi- ness at Microtek, Bob Neves is begin- ning a new journey with his company, Reliability Assessment Solutions Inc. (RAS). He has been instrumental in developing the HATS² test system, channeling his decades of expertise into what could be considered the perfect machine. Bob is working with Andrew Naisbitt, CEO of GEN3, to bring this powerful tool to market. In this interview, Bob and Andrew share the origin of this technology, its impact on the reliability testing land- scape, and how it better addresses specific failures encountered with microvia structures during compo- nent attachment. They acknowledge that after testing the same way for 50 years, change in this industry is hard. But they believe the time for change is now. You'll find out why in this compelling conversation. Barry Matties: Bob, it's always good to see you. You are a recipient of IPC's Hall of Fame Award for your contributions to the industry over the years and have been involved in the test and measurement area for a long time. Now you have been essential in the development of some new technology. How did the development of the HATS² test sys- tem come about? Bob Neves: In 2001, a need arose for a faster reliability test that cycled from cold to hot and would speed up the one-hour dual chamber run cycle. I received a patent and devel- oped the first HATS tester, which cycled PCB board coupons from -55°C to +160°C. Twenty-four years ago, that was pretty novel because people were doing one-hour cycles in a dual chamber, and it took 42 days to do a thousand cycles. We were suc- cessful at compressing that down to about a week. Then some mili- tary projects went away, and it never really took off because it was a bit ahead of its time. A few years ago, the industry had a problem: Microvias failing dur- ing exposure to the high temper- atures were associated with the components being attached to and Interview by Barry Matties Innovative Technology Advancements in Test: HATS² Technology and Its Impact on Reliability Testing