PCB007 Magazine

PCB-Jan2014

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determining phosphorus content in en plating using xrf spectroscopy continues Figure 4: Fluorescence spectra of nickel/phosphorus coatings with different phosphorus content: the intensity of the P-K peak directly represents the phosphorus concentration. Figure 5: Information depth dependence (reciprocal linear attenuation coefficient) for the element nickel. 44 The PCB Magazine • January 2014

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