SMT007 Magazine

SMT-May2014

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62 SMT Magazine • May 2014 Technology Benefits Challenges Notes AoI Quick and easy for operator only visible joints; and diagnostics false call rates are high low cost faster and possibly more consistent than an operator, especially for today's PCBA where components are very small in size (e.g., 0102 capacitors) AXI Able to inspect solder joints Cycle time unable to keep up very useful for HDI and 3D beyond visual contact, such as with production line rate devices and quality ball grid arrays (bgas) and plated through holes (pThs) heavy shading may cause false used as a sample inspection calls in some component types, method or when both sides of a board are loaded with components need expert programming and operator skills MDA low cost fixture limited power up or good enough test for simple digital test capability boards that have high yield low system cost functional test limited capabilities in customizing test sequence lower test stability and accuracy Requires constant fine tuning in test transportability flying Prober Does not require any fixtures very limited power up and not suitable for volume digital test coverage production limited test access situations can be mitigated by probing limited IC testing capabilities on component leads, (max 4 pins at a time) where possible in-Circuit Test Standard test platform across requires test points for highest diagnostic value product types, easy to learn, good test coverage implement & maintain requires good test Test fixture costs engineering skills fast diagnostics Does not test at-speed Has integrated limited access test like boundary scan and programming capabilities functional Test Confirms finished good is low diagnostics functional tests range from working per the specifications quality verification tests from a user point of view Challenging failure analysis (quick tests) to single loop tests & multi-loop Test system customized for DuT reliability tests validates the manufacturing Rework costly process prior to final assembly usually longer test times, causing bottlenecks Able to catch faults from a system level rather than Test specification usually not component level optimized for production Table 1: A myriad of different types of test are available today. PCBa TEST: ENaBLING THE RIGHT maNaGEmENT PRaCTICE continues feATuRe

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