Issue link: https://iconnect007.uberflip.com/i/304995
74 SMT Magazine • May 2014 Even if the manufacturer decides to con- tinue using offline ICT test systems, the offline multisite tester configuration still lowers labor costs because a single multisite tester, with one test operator, can do the work of four standard testers requiring four test operators. an Example Cost Comparison To highlight the economic benefits that can be achieved by high-volume manufactur- ers with the new brand of ICT system, Table 1 shows the three-year ICT ownership costs for an inline dual-site ICT system compared with the costs of two standard offline ICT systems. These numbers were derived in consulta- tion with a manufacturer who was estimating the costs of setting up a high-volume assembly line on their production floor. The manufactur- er calculated that a single standard ICT system would not be capable of keeping up with the beat rate of the production line and that at least two standard ICT systems would be required to test the expected product volumes. The manufacturer also estimated that the assembly line was likely to be retooled 11 times for different product designs over the course of three years and that the average ICT fixture cost for each new product design would be $15K. The cost comparison exercise showed the manufacturer that the inline multisite test ap- proach would save them $651K over three years, compared to the two standard offline ICT system approach. The savings realized by the manufacturer in lower fixture and operator costs alone out- weighed the initial capital equipment costs. The economic model showed that even if it were possible to acquire two offline standard ICT systems for free, the three-year ownership costs of the inline multisite solution would still be $275K less expensive! acknowledgements The author would like to thank John Arena and Bobby Griffis of Teradyne for their contri- butions to many of the ideas and concepts pre- sented in this article. SmT References 1. A. Albee, B. Griffis, "New Directions in Electrical Test Scalabality and Automation," SMTA International Conference Proceedings, October 2013. Table 1: Three-year ownership cost comparison, inline multisite ICT system vs. offline standard ICT system. Alan Albee is a product manager working in Teradyne's Production Test group. He has authored nu- merous technical articles on top- ics related to board test, and he has been awarded two patents. THE CHaNGING ECoNomICS oF IN-CIRCUIT TEST continues feATuRe