February 2015 • SMT Magazine 1
F
e
b
r
u
a
r
y
2
0
1
5
electrostatic Mechanism
of Nucleation and Growth
of Metal Whiskers p.28
Tin Whiskers: Why
Testing Temperature Can
Change the Outcome p.46
Tin Whisker Growth on
the Surface of Tin-rich
Lead-Free alloys p.56
Much More!
EnginEEring solutions for pcb manufacturing
m a g a z i n E
Risk and Mitigation for
Tin Whiskers and Tin Pest
by Dr. Ronald C. Lasky, page 18
