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February 2015 • SMT Magazine 1 F e b r u a r y 2 0 1 5 electrostatic Mechanism of Nucleation and Growth of Metal Whiskers p.28 Tin Whiskers: Why Testing Temperature Can Change the Outcome p.46 Tin Whisker Growth on the Surface of Tin-rich Lead-Free alloys p.56 Much More! EnginEEring solutions for pcb manufacturing m a g a z i n E Risk and Mitigation for Tin Whiskers and Tin Pest by Dr. Ronald C. Lasky, page 18

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