Issue link: https://iconnect007.uberflip.com/i/1507822
SEPTEMBER 2023 I PCB007 MAGAZINE 99 are bought from outside vendors. SPCF can give these vendors precise data on the type, location, and extent of defects. SPCF estimates that the new system has reduced repair labor costs by 30% because of reduced defects, fewer phantom errors, and prior knowledge of systematic defects. In addi- tion, the system shortens test setup time by one hour per machine daily. Also, testing in panel form is several times faster than testing finished boards. Significant labor savings are seen in a number of other ways, because the system has practically eliminated paperwork that used to burden the operators, their super- visor, and process engineers. Figure 8 illus- trates an operator in the process of testing a two-image panel. Product cost analysis has been improved due to repair information and accurate test time information. Test costs can be predicted as well as machine throughput. e test area and affiliated soware was developed by test engineers from 1979 to 1981. e soware was written and implemented in three phases to match test demands as well as available resources. • Phase 1 was to develop error translation, error correlation, and a useful test results report. is was implemented on an IMSAI microcomputer in 8080 assembly language. • Phase 2 was to interface all five machines to the HP1000 and generate in FORTRAN the control programs established as useful in Phase 1. Figure 7: Electrical test, AOI and quality analysis control center.