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92 SMT007 MAGAZINE I DECEMBER 2021 IPC: What are some of the significant changes in the standards? Fourcade: Both documents went under some great changes and synergy between them. e most significant change in A-610H was removing target conditions entirely in line with A-620D. Also, some re-structuring of ESD into an ap- pendix and the jumper wires criteria into a new section 13, in which I was personally involved with the Kangaroo team. J-STD-001H brings some critical industry consensus on cleaning, a new appendix for X-ray guidelines, and both documents incorporated new SMT termination criteria: wrapped terminals. e leaders and IPC liaisons did an outstanding job handling all these changes and getting it done. IPC: Why are J-STD-001H and IPC-A-610H important to the industry? Fourcade: ese documents are called out when the industry needs reliable electronics. eir importance is held by the industry itself demanding a standardized baseline to build electronics better. IPC: Should these documents be used togeth- er? Fourcade: Users are encouraged to use these documents together to best aid their inspec- tion process. Interpretation leads sometimes to misconceptions of the intended use. As de- fined by the scope of each document, a user may apply J-STD-001 to their entire manu- facturing process, whereas A-610 is applicable only during inspection, mainly for reference and training. IPC: ank you for all your work on the com- mittees. Fourcade: ank you. SMT007 Validation, this entire webinar series can be viewed in about an hour and covers a comprehensive range of topics surrounding the four groundbreaking test standards published between 2019 and 2021 that set the scene for "Objective Evidence" and its widespread influence throughout the world of electronics, whether in the high reliability arena of space, medical, automotive or general industrial applications. Visit Predicting Reliability in Electronics and start watching, free, today! Watch & Learn! I-Connect007 Launches New Video Series: 'Pre- dicting Reliability in Electronics' Presented by the Experts at GEN3 In this engaging, 11-part micro webinar series, top- ic experts Graham Naisbitt and Chris Hunt examine the history of the influences of electrochemical mi- gration (ECM) and the evolving use of Surface Insu- lation Resistance (SIR) testing that has been devel- oped over the past 25 years by GEN3 and its asso- ciation with the British National Physical Laborato- ry. GEN3 and NPL have created the standard that has now been in widespread use around the world since the turn of the millennium. It was only in 2017 that, together with their cus- tomer Robert Bosch, they were able to demonstrate the insufficiency that has been the ROSE test ac- cept/reject of 1.56 µg/cm2 NaCl equivalence, which has remained unchanged since the mid-1970s. Designed to complement GEN3's book, The Printed Circuit Assembler's Guide to...Process

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