Issue link: https://iconnect007.uberflip.com/i/1511625
NOVEMBER 2023 I PCB007 MAGAZINE 41 Figure 5: Highly accelerated thermal shock (HATS) is accomplished by: a) generating refrigerated and heated air passing over the test fixture which contains: b) 36 test coupons as shown; c) the 1.0" x 1.0"; or d) the 2.0" x 1.0"; or e) the 0.5" x 1.0" coupons; f) HATS; 2 g) IPC-2221 Type D 5 . Interconnect Stress Test™ (IST) IST is the oldest and now most used acceler- ated thermal via reliability system in the indus- try. Developed in 1989 by Digital Equipment of Canada, patented in 1994, and commercialized by PWB Interconnect Solutions in 1995, over 100 systems have been installed worldwide. Used by over 120 OEMs, EMS companies, and PCB fabricators, it has six licensed service cen- ters around the world and is standardized by the IPC-TM-650 Test Method 2.6.26, the DC current-induced thermal cycling test.