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56 SMT007 MAGAZINE I APRIL 2025 Future Work More extensive research is needed to fully understand how overexposure affects the functional performance of DRAM. is includes conducting detailed failure analy- ses to identify specific performance degrada- tion that may occur. Additionally, it is crucial to perform aging studies to assess the long- term reliability of these devices. Such stud- ies will help determine how DRAM compo- nents behave over time aer being initially exposed to radiation. SMT007 References 1. "Considerations for minimizing radiation doses to components during X-ray inspection," by David Bernard and Richard C. Blish, 2005 7th Electronic Packaging Technology Conference 2, 8 pp, 2003. 2. "Filter optimization for X-ray inspection of surface-mounted ICs," by R. C. Blish, S. X. Li, and D. Lehtonen. IEEE Transactions on Device and Materials Reliability, vol. 2, no. 4, pp. 102-106, Dec. 2002. 3. "X-Ray Radiation Effect in DRAM Retention Time," by Akram Ditali, Manny Ma, and M. John- ston. IEEE Transactions on Device and Materials Reliability 7, 105-111, 2007. 4. "Radiation-Induced Variable Retention Time in Dynamic Random Access Memories," by Vincent Goiffon, Antoine Jay, Philippe Paillet, Teddy Bilba, Théo Deladerrière, Guillaume Beaugendre, Alexan- dre Le Roch, Arnaud Dion, Cédric Virmontois, Jean- Marc Belloir, and Marc Gaillardin, IEEE Transactions on Nuclear Science 67 (2020): 234-244. 5. "An Evaluation of X-Ray Irradiation Induced Dynamic Refresh Characterization in DRAM," by Kyungwoo Lee, Chae-Hyuk Yun, HyungAh Seo, Tae hun Kang, Yunsung Lee, and Kangyong Cho. 2019 IEEE International Reliability Physics Symposium (IRPS), IEEE Press, 1-3, 2019. 6. "Impact of X-Ray Radiation on the Reliability of Logic Integrated Circuits," by Somayyeh Rahimi, Christian Schmidt, Joy Liao, Howard Lee Marks, and Kyung Mo Shin. 2020 IEEE International Reliability Physics Symposium (IRPS), IEEE Press, 1–4, 2020. This paper was written by Saurabh Gupta, Howlit Chng, Michael Cath- cart, Christopher Alvarez, Jose I Hernandez, Jeff Burgess, all of Intel Corporation. Interview by Barry Matties After walking off the stage at IPC APEX EXPO, where he re- ceived the IPC Raymond E. Pritchard Hall of Fame Award, I caught up with Peter Big- elow to find out how it felt to receive the award and what advice he has for others com- ing up through the industry. Barry Matties: Peter, you just received the IPC Raymond E. Pritchard Hall of Fame award. What's that like? Peter Bigelow: I'm honored, and frankly, quite sur- prised, to have received the award. I'm excited to say that I've been part of IPC for so many years and have been able to make a contribution to the indus- try as well as to the association. With all your years of wisdom and experience, what advice would you give a young person coming into the industry now? Peter Bigelow: Perseverance Paid Off Get involved, and even more, you need to get to know the people that are on the committees and in the industry. They can be a wonderful personal sup- port system. You learn so much more when you get to interact with people who are doing the same thing you're doing but maybe you're coming from a differ- ent angle and different perspective. How long have you been at this? I've been in circuit boards for 34 years. I've been in the electronics industry since 1977. Will you share one of the most memorable mo- ments of your esteemed career? Oh, that's a tough one. I would say it was taking the leap of faith to acquire a company. and work it through very challenging times. The industry was not in a robust state at that time, but just by having patience, working with good people, taking it one day at a time and paying attention to the future, not worrying about the moment, it was a proud time of my career. That has been a proud moment for me.